IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture
IEEE Test Technology Standards CommitteeNăm:
2022
Nhà xuát bản:
IEEE
Ngôn ngữ:
english
ISBN 10:
150448875X
ISBN 13:
9781504488754
File:
PDF, 29.03 MB
IPFS:
,
english, 2022